(1) 以上值基于 JEDEC 定義的 2S2P 系統(基于 JEDEC 定義的 1S0P 系統的 Theta JC [RΘJC] 值除外),將隨環境和應用的變化而更改。有關更多信息,請參閱以下 EIA/JEDEC 標準:
- JESD51-2, Integrated Circuits Thermal Test Method Environment Conditions - Natural Convection (Still Air)
- JESD51-3, Low Effective Thermal Conductivity Test Board for Leaded Surface Mount Packages
- JESD51-6, Integrated Circuit Thermal Test Method Environmental Conditions - Forced Convection (Moving Air)
- JESD51-7, High Effective Thermal Conductivity Test Board for Leaded Surface Mount Packages
- JESD51-9, Test Boards for Area Array Surface Mount Packages