ZHCSJK5D January 2018 – June 2022 TCAN4550-Q1
PRODUCTION DATA
All TXD_INT, RXD_INT and EN_INT references are for internal nodes that represent the same functions for a physical layer transceiver. In test mode these can be brought out to pins to test the transceiver or CAN FD controller.
Figure 7-1 Bus States (Physical Bit
Representation)
A: Selective Wake
B: Standby and Sleep Modes (Low Power)
Figure 7-3 Supply Test
Circuit
Figure 7-4 Driver Test Circuit and
Measurement
Figure 7-5 Receiver Test Circuit and
Measurement
Figure 7-6 Transmitter and Receiver
Timing Behavior Test Circuit and Measurement
Figure 7-7 TXD_INT Dominant Timeout
Test Circuit and Measurement
Figure 7-8 Driver Short-Circuit
Current Test and Measurement
Figure 7-9 tWAKE While
Monitoring INH Output
Figure 7-10 Test Signal Definition for
Bias Reaction Time Measurement
Figure 7-11 SPI AC Characteristic
Write
Figure 7-12 SPI AC Characteristic
Read
Figure 7-13 Power Up Timing
Figure 7-14 Sleep to Standby
Timing
Figure 7-15 Normal to Sleep
Timing
Figure 7-16 Normal to Standby
Timing