SLVK181 January 2025 DRV8351-SEP
- 1
- Abstract
- Trademarks
- 1 Introduction
- 2 Single-Event Effects (SEE)
- 3 Device and Test Board Information
- 4 Irradiation Facility and Setup
- 5 Depth, Range, and LETEFF Calculation
- 6 Test Setup and Procedures
- 7 Destructive Single-Event Effects (DSEE)
- 8 Single-Event Transients (SET)
- 9 Event Rate Calculations
- 10Summary
- A References
7.1 Single-Event Latch-up (SEL) Results
During the SEL testing the device was heated to 125°C by using a Closed-Loop PID controlled heat gun (MISTRAL 6 System (120V, 2400W). The temperature of the die was verified using thermal camera prior to exposure to heavy ions.
The species used for the SEL testing was Silver (109Ag at 15MeV / nucleon). For the 109Ag ion an angle of incidence of 0° was used to achieve an LETEFF = 47.2MeV × cm2 / mg (for more details, see Ion LETEFF, Depth, and Range in Silicon). The kinetic energy in the vacuum for Silver is 1.634 GeV. Flux of approximately 105 ions / cm2× s and a fluence of approximately 107 - 10.57 ions / cm2 per run was used. Run duration to achieve this fluence was approximately 100 seconds. No SEL events were observed on GVDD on any run. PVDD hits the current clamp of 400mA under certain conditions, specifically when we took frequency above 150kHz. The spikes in current show in the graphs below always seemed to recover back to nominal current draw assuming frequency was under 125kHz. Table 8-4 shows the SEL test conditions and results.
| Device | Board Number | Run Number | Ion | LETEFF (MeV × cm2 / mg) | Flux (ions × cm2 / mg) | Fluence (Number of ions) | Frequency | Phase | GVDD | PVDD | GVDD Pre Beam_Current (mA) | GVDD Post Beam_Current (mA) | PVDD Pre Beam_Current (mA) | PVDD PostBeam_Current (mA) |
|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
DRV8351-SEP | 11 | 23 | 109Ag | 47.2 | 1.01E5 | 1E7 | 20kHz | A | 15 | 42.5 | 12.13 | 11.92 | 16.37 | 16.44 |
| DRV8351-SEP | 10 | 20 | 109Ag | 47.2 | 7.8E4 | 1E7 | 20kHz | B | 15 | 42.5 | 12.22 | 12.81 | 15.81 | 15.94 |
| DRV8351-SEP | 13 | 29 | 109Ag | 47.2 | 1.07E5 | 1E7 | 20kHz | C | 15 | 42.5 | 11.74 | 12.32 | 15.2 | 15.54 |
| DRV8351-SEP | 1 | 2 | 109Ag | 47.2 | 1.12E5 | 1E7 | 125kHz | A | 15 | 42.5 | 66.35 | 66.45 | 88.86 | 88.81 |
DRV8351-SEP | 2 | 7 | 109Ag | 47.2 | 1.17E5 | 1.5E7 | 125kHz | B | 15 | 42.5 | 63.09 | 63.07 | 86.04 | 86.01 |
DRV8351-SEP | 13 | 30 | 109Ag | 47.2 | 1.07E7 | 1E7 | 125kHz | C | 15 | 42.5 | 63.35 | 63.31 | 86.98 | 86.91 |
Using the MFTF method shown in Single-Event Effects (SEE) Confidence Interval Calculations and combining (or summing) the fluences of the four runs at 125°C (4 × 107), the upper-bound cross-section (using a 95% confidence level) is calculated as:
Figure 7-1 SEL Run 23 (fsw = 20kHz) - GVDD
Figure 7-2 SEL Run 23 (fsw = 20kHz) - PVDD
Figure 7-3 SEL Run 30(fsw = 125kHz) - GVDD
Figure 7-4 SEL Run 30(fsw = 125kHz) - PVDD