Abstract

The purpose of this study is to characterize the single-event effects (SEE) performance due to heavy-ion irradiation of the DRV8351-SEP. Heavy-ions with LET_EFF of 20.3, 30.1, 43.1 and 47.2MeV × cm² / mg, was used to irradiate four production devices. Flux of approximately 10⁵ ions / cm² × s and fluence of approximately 10⁷ ions / cm² per run were used for the characterization. The results demonstrate the performance of the DRV8351-SEP under SEL and SEB conditions at T = 125°C and T = 25°C, respectively. SET transients performance for output pulse width excursions ≥ |10%| from the nominal width and positive and negative edge transients on GHx,GLx, and SHx are presented and discussed.