SLVK181 January 2025 DRV8351-SEP
The DRV8351-SEP is a radiation-hardness-assured (RHA) 40V three half-bridge gate drivers, capable of driving high-side and low-side N-channel power MOSFETs. The DRV8351-SEP generates the correct gate drive voltages using an integrated bootstrap diode and external capacitor for the highside MOSFETs. GVDD is used to generate gate drive voltage for the low-side MOSFETs. The Gate Drive architecture supports peak up to 750mA source and 1.5A sink currents. The driver features:
6x PWM requires all INH and INL inputs to be supplied
3x PWM mode the user also has the ability to enable or disable the turn-on of both outputs when both inputs are on simultaneously (interlock protection). This gives the driver the ability to be used in multiple converter configurations.
The device is offered in a 20-pin plastic package. General device information and test conditions are listed in Table 1-1. For more detailed technical specifications, user guides, and application notes, see theDRV8351-SEP product pages.
| Description(1) | Device Information |
|---|---|
| TI part number | DRV8351-SEP |
| Orderable number | DRV8351DMPWTSEP, DRV8351DIMPWTSEP |
| Device function | 40V Three Phase Half-Bridge Gate driver |
| Technology | LBC9 (Linear BiCMOS 9) |
| Exposure facility | Radiation Effects Facility, Cyclotron Institute, Texas A&M University (15 MeV / nucleon) |
| Heavy ion fluence per run | 1.0 × 106 – 1.5 × 107 ions / cm2 |
| Irradiation temperature | 25°C (for SEB), 25°C (for SET testing), and 125°C (for SEL testing) |