SLVK181 January 2025 DRV8351-SEP
- 1
- Abstract
- Trademarks
- 1 Introduction
- 2 Single-Event Effects (SEE)
- 3 Device and Test Board Information
- 4 Irradiation Facility and Setup
- 5 Depth, Range, and LETEFF Calculation
- 6 Test Setup and Procedures
- 7 Destructive Single-Event Effects (DSEE)
- 8 Single-Event Transients (SET)
- 9 Event Rate Calculations
- 10Summary
- A References
8 Single-Event Transients (SET)
The primary focus of SETs were heavy-ion-induced transient upsets on the output signals GH,GL, and SH. SET testing was done at room temperature across three ion species, 109Ag, 84Kr , and 63Cu which produced a range of LETEFF of 20.3 to 47.2MeV × cm2 / mg for more details, see Ion LETEFF, Depth, and Range in Silicon. GH, GL, and SH were monitored by a single scope, a NI PXIe-5172. Additionally a NI PXIe-5110 was monitoring SH. During PWM, the PXIe 5172 was configured to trigger based on an outside window width measurement. As for the PXIe 5110, the pulse width trigger for the output signal was 10%. The window for the 5172 was set to trigger on GL, if it went +/- 2V out of it's expected switching condition this would be counted as a trigger. As for the 5110, if the pulse width was +/- 10% off from the expected pulse width, this would be counted as a trigger.
| Scope Model | Trigger Signal | Trigger Type | Trigger Value | Record Length | Sample Rate |
|---|---|---|---|---|---|
| PXIe-5172 | GL | Window | ±2V | 4000 | 20MS / s |
| PXIe-5110 | SH | Pulse Width | ± 10% | 4000 | 20MS / s |
| Device | Board Number | Run Number | Ion | LETEFF (MeV × cm2 / mg) | Flux (ions × cm2/ mg) | Fluence (number of ions) | Frequency | Phase | GVDD | PVDD | Number of Transients GL | Number of Transients SH |
|---|---|---|---|---|---|---|---|---|---|---|---|---|
DRV8351-SEP | 7 | 10 | Ag | 47.2 | 1E5 | 1E7 | 20kHz | A | 15 | 42.5 | 72 | 14 |
| DRV8351-SEP | 8 | 13 | Ag | 47.2 | 1E5 | 1E7 | 20kHz | B | 15 | 42.5 | 22 | 65 |
| DRV8351-SEP | 9 | 15 | Ag | 47.2 | 1E5 | 1E7 | 20kHz | C | 15 | 42.5 | 16 | 46 |
| DRV8351-SEP | 11 | 22 | Ag | 47.2 | 1.1E5 | 1E7 | 200kHz | A | 15 | 42.5 | 51 | 50 |
| DRV8351-SEP | 10 | 18 | Ag | 47.2 | 8.4E4 | 1E7 | 200kHz | B | 15 | 42.5 | 60 | 49 |
| DRV8351-SEP | 9 | 17 | Ag | 47.2 | 9.66E4 | 9.96E6 | 200kHz | C | 15 | 42.5 | 161 | 69 |
| DRV8351-SEP | 4 | 11 | Kr | 30.6 | 9.76E4 | 1E7 | 20kHz | A | 13 | 30 | 54 | 10 |
| DRV8351-SEP | 4 | 14 | Kr | 30.6 | 1.1E5 | 1E7 | 20kHz | A | 10 | 20 | 145 | 90 |
| DRV8351-SEP | 4 | 16 | Kr | 30.6 | 1.01E5 | 1E7 | 20kHz | A | 10 | 10 | 158 | 60 |
| DRV8351-SEP | 8 | 18 | Cu | 20.3 | 1.07E5 | 1E7 | 20kHz | A | 13 | 30 | 84 | 16 |
| DRV8351-SEP | 8 | 19 | Cu | 20.3 | 1.07E5 | 1E7 | 20kHz | A | 10 | 20 | 120 | 84 |
| DRV8351-SEP | 8 | 20 | Cu | 20.3 | 1.12E5 | 1E7 | 20kHz | A | 10 | 45 | 118 | 109 |
Figure 8-1 Cross Conduction SET Run 9 Zoomed Out (fsw = 20kHz) 47.2MeV
Figure 8-2 Cross Conduction SET Run 9 Zoomed in 1 (fsw = 20kHz) 47.2MeV
Figure 8-3 Cross Conduction SET Run 9 Zoomed in 2 (fsw = 20kHz) 47.2MeV