SLVK181 January   2025 DRV8351-SEP

1.   1
2.   Abstract
3.   Trademarks
4. 1 Introduction
5. 2 Single-Event Effects (SEE)
6. 3 Device and Test Board Information
7. 4 Irradiation Facility and Setup
8. 5 Depth, Range, and LETEFF Calculation
9. 6 Test Setup and Procedures
10. 7 Destructive Single-Event Effects (DSEE)
    1. 7.1 Single-Event Latch-up (SEL) Results
    2. 7.2 Single-Event Burnout (SEB)
11. 8 Single-Event Transients (SET)
12. 9 Event Rate Calculations
13. 10Summary
14.   A References