ZHCSQS2I January 1983 – July 2022 TL494
PRODUCTION DATA
- 1 特性
- 2 應(yīng)用
- 3 說(shuō)明
- 4 簡(jiǎn)化版方框圖
- 5 修訂歷史記錄
- 6 引腳配置和功能
- 7 規(guī)格
- 8 參數(shù)測(cè)量信息
- 9 詳細(xì)說(shuō)明
- 10應(yīng)用和實(shí)現(xiàn)
- 11電源相關(guān)建議
- 12布局
- 13器件和文檔支持
- 14機(jī)械、封裝和可訂購(gòu)信息
封裝選項(xiàng)
機(jī)械數(shù)據(jù) (封裝 | 引腳)
散熱焊盤(pán)機(jī)械數(shù)據(jù) (封裝 | 引腳)
訂購(gòu)信息
13.2 Electrostatic Discharge Caution
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This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with appropriate precautions. Failure to observe proper handling and installation procedures can cause damage. |
| ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more susceptible to damage because very small parametric changes could cause the device not to meet its published specifications. |