SLUAB11 November   2025 AMC23C12-Q1 , TMCS1126-Q1 , UCC21750-Q1

1.   1
2.   Abstract
3.   Trademarks
4. 1Introduction
   1. 1.1 Difference Between SiC and IGBT
   2. 1.2 System SCP Response Time Requirement
   3. 1.3 Different SCP Locations
5. 2Short-Circuit Mechanism
6. 3Short Circuit Detection Methods
   1. 3.1 Shunt-Based Method
   2. 3.2 Desaturation-Based Method
   3. 3.3 Hall-Effect Sensor-Based Method
7. 4Test Setup
8. 5Measurement Results
   1. 5.1 Shunt Based Measurements
   2. 5.2 Desaturation-Based Measurements
   3. 5.3 Hall-Effect-Sensor Measurements
   4. 5.4 Performance Comparison
9. 6Conclusion
10. 7References