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ZHCSDD8D October 2014 – December 2019 TPS1H100-Q1

PRODUCTION DATA.

封裝選項(xiàng)

機(jī)械數(shù)據(jù) (封裝 | 引腳)

PWP|14
- MPDS370A

散熱焊盤機(jī)械數(shù)據(jù) (封裝 | 引腳)

PWP|14
- PPTD393A

訂購信息

8.2.2.3 EMC Transient Disturbances Test

Due to the severe electrical conditions in the automotive environment, immunity capacity against electrical transient disturbances is required, especially for a high-side power switch, which is connected directly to the battery. Detailed test requirements are in accordance with the ISO 7637-2:2011 and ISO 16750-2:2010 standards. The TPS1H100-Q1 device is tested and certificated by a third-party organization.

Table 5. ISO 7637-2:2011(E) in 12-V System⁽¹⁾⁽²⁾⁽³⁾⁽⁴⁾

Test Item	Test Pulse Severity Level and vs Accordingly		Pulse Duration (t_d)	Minimum Number of Pulses or Test Time	Burst-Cycle Pulse-Repetition Time		Input Resistance (Ω)	Function Performance Status Classification
Test Item	Level	Vs/V	Pulse Duration (t_d)	Minimum Number of Pulses or Test Time	MIN	MAX	Input Resistance (Ω)	Function Performance Status Classification
1	III	–112	2 ms	500 pulses	0.5 s	e s	10	Status II
2a	III	55	50 µs	500 pulses	0.2 s	5 s	2	Status II
2b	IV	10	0.2 to 2 s	10 pulses	0.5 s	5 s	0 to 0.05	Status II
3a	IV	–220	0.1 µs	1h	90 ms	100 ms	50	Status II
3b	IV	150	0.1 µs	1h	90 ms	100 ms	50	Status II

(1) Tested both under input low condition and high condition.

(2) Considering the worst test condition, it is tested without any filter capacitors in V_S and V_OUT.

(3) GND pin network is a 1-kΩ resistor in parallel with a diode BAS21-7-F.

(4) Status II: The function does not perform as designed during the test, but returns automatically to normal operation after the test.

Table 6. ISO 16750-2:2010(E) Load Dump Test B in 12-V System⁽¹⁾⁽²⁾⁽³⁾⁽⁴⁾⁽⁵⁾

Test Item	Test Pulse Severity Level and vs Accordingly		Pulse Duration (t_d)	Minimum Number of Pulses or Test Time	Burst Cycle/Pulse Repetition Time		Input Resistance (Ω)	Function Performance Status Classification
Test Item	Level	Vs/V	Pulse Duration (t_d)	Minimum Number of Pulses or Test Time	MIN (s)	MAX (s)	Input Resistance (Ω)	Function Performance Status Classification
Test B		45	40 to 400 ms	5 pulses	60	e	0.5 to 4	Status II

(1) Tested both under input low condition and high condition. [DIAG_EN, IN, and VS are all classified as inputs. Which one?

(2) Considering the worst test condition, the device is tested without any filter capacitors on VS and OUT.

(3) The GND pin network is a 1-kΩ resistor in parallel with a diode BAS21-7-F.