5.1 Absolute Maximum Ratings(2)(3)
over operating free-air temperature range (unless otherwise noted)
|
MIN |
MAX |
UNIT |
| Supply voltage(1) |
CVDD |
-0.3 |
1.3 |
V |
| CVDD1 |
-0.3 |
1.3 |
| DVDD15 |
-0.3 |
2.45 |
| DVDD18 |
-0.3 |
2.45 |
| VREFSSTL |
0.49 × DVDD15 |
0.51 × DVDD15 |
| VDDT1, VDDT2 |
-0.3 |
1.3 |
| VDDR1, VDDR2, VDDR3, VDDR4 |
-0.3 |
2.45 |
| AVDDA1, AVDDA2 |
-0.3 |
2.45 |
| VSS Ground |
|
0 |
| Input voltage (VI) |
LVCMOS (1.8V) |
-0.3 |
DVDD18+0.3 |
V |
| DDR3 |
-0.3 |
2.45 |
| I2C |
-0.3 |
2.45 |
| LVDS |
-0.3 |
DVDD18+0.3 |
| LJCB |
-0.3 |
1.3 |
| SerDes |
-0.3 |
CVDD1+0.3 |
| Output voltage (VO) |
LVCMOS (1.8V) |
-0.3 |
DVDD18+0.3 |
V |
| DDR3 |
-0.3 |
2.45 |
| I2C |
-0.3 |
2.45 |
| SerDes |
-0.3 |
CVDD1+0.3 |
| Overshoot/undershoot(4) |
LVCMOS (1.8V) |
20% Overshoot/Undershoot
for 20% of Signal Duty Cycle |
|
| DDR3 |
| I2C |
| Storage temperature, Tstg |
–65 |
150 |
°C |
(1) All voltage values are with respect to VSS.
(2) Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings only, and functional operation of the device at these or any other conditions beyond those indicated under Recommended Operating Conditions is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
(3) All voltage values are with respect to VSS, unless otherwise noted.
(4) Overshoot/Undershoot percentage relative to I/O operating values - for example the maximum overshoot value for 1.8-V LVCMOS signals is DVDD18 + 0.20 × DVDD18 and maximum undershoot value would be VSS - 0.20 × DVDD18