ZHCSNW8A October 2022 – December 2022 LMG2610
PRODUCTION DATA
| PARAMETER | TEST CONDITIONS | MIN | TYP | MAX | UNIT | |
|---|---|---|---|---|---|---|
| LOW-SIDE GAN POWER FET | ||||||
| td(on)(Idrain)(ls) | Drain current turn-on delay time | From VINL > VINL,IT+ to ID(ls) > 50 mA, VBUS = 400 V, LHB current = 2 A, at below low-side slew rate settings, see GaN Power FET Switching Parameters | ||||
| slew rate setting 0 (slowest) | 68 | ns | ||||
| slew rate setting 1 | 40 | |||||
| slew rate setting 2 | 35 | |||||
| slew rate setting 3 (fastest) | 34 | |||||
| td(on)(ls) | Turn-on delay time | From VINL > VINL,IT+ to VDS(ls) < 320 V, VBUS = 400 V, LHB current = 2 A, at below low-side slew rate settings, see GaN Power FET Switching Parameters | ||||
| slew rate setting 0 (slowest) | 91 | ns | ||||
| slew rate setting 1 | 50 | |||||
| slew rate setting 2 | 43 | |||||
| slew rate setting 3 (fastest) | 37 | |||||
| tr(on)(ls) | Turn-on rise time | From VDS(ls) < 320 V to VDS(ls) < 80 V, VBUS = 400 V, LHB current = 2 A, at below low-side slew rate settings, see GaN Power FET Switching Parameters | ||||
| slew rate setting 0 (slowest) | 14.9 | ns | ||||
| slew rate setting 1 | 5.6 | |||||
| slew rate setting 2 | 3.8 | |||||
| slew rate setting 3 (fastest) | 1.9 | |||||
| td(off)(ls) | Turn-off delay time | From VINL < VINL,IT– to VDS(ls) > 80 V, VBUS = 400 V, LHB current = 2 A, (independent of slew rate setting), see GaN Power FET Switching Parameters | 43 | ns | ||
| tf(off)(ls) | Turn-off fall time | From VDS(ls) > 80 V to VDS(ls) > 320 V, VBUS = 400 V, LHB current = 2 A, (independent of slew rate setting), see GaN Power FET Switching Parameters | 12.5 | ns | ||
| Turn-on slew rate | From VDS(ls) < 250 V to VDS(ls) < 150 V, TJ = 25 ℃, VBUS = 400 V, LHB current = 2 A, at below low-side slew rate settings, see GaN Power FET Switching Parameters | |||||
| slew rate setting 0 (slowest) | 20 | V/ns | ||||
| slew rate setting 1 | 50 | |||||
| slew rate setting 2 | 70 | |||||
| slew rate setting 3 (fastest) | 140 | |||||
| HIGH-SIDE GAN POWER FET | ||||||
| td(on)(Idrain)(hs) | Drain current turn-on delay time | From VINH > VINH,IT+ to ID(hs) > 50 mA, VBUS = 400 V, LHB current = 2 A, at below high-side slew rate settings, see GaN Power FET Switching Parameters | ||||
| slew rate setting 0 (slowest) | 60 | ns | ||||
| slew rate setting 1 | 34 | |||||
| slew rate setting 2 | 31 | |||||
| slew rate setting 3 (fastest) | 28 | |||||
| td(on)(hs) | Turn-on delay time | From VINH > VINH,IT+ to VDS(hs) < 320 V, VBUS = 400 V, LHB current = 2 A, at below high-side slew rate settings, see GaN Power FET Switching Parameters | ||||
| slew rate setting 0 (slowest) | 86 | ns | ||||
| slew rate setting 1 | 46 | |||||
| slew rate setting 2 | 39 | |||||
| slew rate setting 3 (fastest) | 32 | |||||
| tr(on)(hs) | Turn-on rise time | From VDS(hs) < 320 V to VDS(hs) < 80 V, VBUS = 400 V, LHB current = 2 A, at below high-side slew rate settings, see GaN Power FET Switching Parameters | ||||
| slew rate setting 0 (slowest) | 13.1 | ns | ||||
| slew rate setting 1 | 4.7 | |||||
| slew rate setting 2 | 3.2 | |||||
| slew rate setting 3 (fastest) | 1.7 | |||||
| td(off)(hs) | Turn-off delay time | From VINH < VINH,IT– to VDS(hs) > 80 V, VBUS = 400 V, LHB current = 2 A, (independent of slew rate setting), see GaN Power FET Switching Parameters | 37 | ns | ||
| tf(off)(hs) | Turn-off fall time | From VDS(hs) > 80 V to VDS(hs) > 320 V, VBUS = 400 V, LHB current = 2 A, (independent of slew rate setting), see GaN Power FET Switching Parameters | 12.5 | ns | ||
| Turn-on slew rate | From VDS(hs) < 250 V to VDS(hs) < 150 V, TJ = 25 ℃, VBUS = 400 V, LHB current = 2 A, at below high-side slew rate settings, see GaN Power FET Switching Parameters | |||||
| slew rate setting 0 (slowest) | 20 | V/ns | ||||
| slew rate setting 1 | 65 | |||||
| slew rate setting 2 | 90 | |||||
| slew rate setting 3 (fastest) | 165 | |||||
| CS | ||||||
| Settling time | From ICS > 0.1*ICS(src)(final) to ICS < 0.9*ICS(src)(final), Low-side enabled into a 2 A load, 0 V ≤ VCS ≤ 2 V, | 35 | ns | |||
| EN | ||||||
| EN wake-up time | VINL = 5 V, From VEN > VIT+ to ID(ls) > 10 mA | 1 | μs | |||
| BST | ||||||
| Start-up time from deep BST to SW discharge | From VBST_SW ≥ VBST_SW,T+(UVLO) to high-side reacts to INH rising edge with VBST_SW rising from 0 V to 10 V in 1 μs | 5 | μs | |||
| Start-up time from shallow BST to SW discharge | From VBST_SW ≥ VBST_SW,T+(UVLO) to high-side reacts to INH rising edge with VBST_SW rising from 5 V to 10 V in 0.5 μs | 2 | μs | |||