Unless otherwise noted, these specifications apply for +VS = 3V (DC) and ILOAD = 1μA. All limits TA = TJ = 25°C unless otherwise noted.
| PARAMETER |
TEST CONDITIONS |
MIN(1) |
TYP(2) |
MAX(1) |
UNIT |
| SENSOR ACCURACY |
| TACY |
Temperature accuracy(3) |
LM60B(4) |
|
-2 |
|
2 |
°C |
| TA = TJ = TMIN to TMAX |
-3 |
|
3 |
| LM60C |
|
-3 |
|
3 |
| TA = TJ = TMIN to TMAX |
-4 |
|
4 |
| SENSOR OUTPUT |
| V0°C |
Output voltage offset at 0°C |
|
|
|
424 |
|
mV |
| TC |
Temperature coefficient (sensor gain) |
|
|
|
6.25 |
|
mV/°C
|
| LM60B |
TA = TJ = TMIN to TMAX |
6.06 |
|
6.44 |
| LM60C |
TA = TJ = TMIN to TMAX |
6 |
|
6.5 |
| VONL |
Output Nonlinearity(5) |
LM60B |
TA = TJ = TMIN to TMAX |
-0.6 |
|
0.6 |
°C |
| LM60C |
TA = TJ = TMIN to TMAX |
-0.8 |
|
0.8 |
| ZOUT |
Output impedance |
|
|
|
|
800 |
? |
| TLTD |
Long-term stability and drift(6) |
TJ = TMAX = 125°C for 1000 hours |
|
|
±0.2 |
|
°C |
| POWER SUPPLY |
| IDD |
Operating current |
LM60, 2.7V ≤ +VS ≤ 10V |
Legacy chip |
|
82 |
110 |
μA |
| New chip |
|
52 |
70 |
TA = TJ = TMIN to TMAX
Legacy chip |
|
|
125 |
TA = TJ = TMIN to TMAX
New chip |
|
|
90 |
| PSR |
Line regulation(7) |
LM60, 2.7V ≤ +VS ≤ 3.3V |
TA = TJ = TMIN to TMAX |
-2.3 |
|
2.3 |
mV |
| LM60, 3V ≤ +VS ≤ 10V |
TA = TJ = TMIN to TMAX |
-0.3 |
|
0.3 |
mV/V |
| ΔIDD |
Change of quiescent current |
LM60, 2.7V ≤ +VS ≤ 10V |
Legacy chip |
|
±5 |
|
μA |
| New chip |
|
±6.5 |
|
| IDD_TEMP |
Temperature coefficient of quiescent current
|
|
|
|
0.2 |
|
μA/°C |
(1) Limits are specified to TI's AOQL (Average Outgoing Quality Level).
(2) Typicals are at TJ = TA = 25°C and represent most likely parametric norm.
(3) Accuracy is defined as the error between the output voltage and 6.25mV/°C times the case temperature of the device plus 424mV, at specified conditions of voltage, current, and temperature (expressed in °C).
(4) LM60B (Legacy chip) operates down to –40°C without damage but the accuracy is only verified from –25°C to 125°C. However, LM60B (New chip) specs are verified from –40°C to 125°C.
(5) Nonlinearity is defined as the deviation of the output-voltage-versus-temperature curve from the best-fit straight line, over the rated temperature rating of the device
(6) For best long-term stability, any precision circuit provides the best results if the unit is aged at a warm temperature, temperature cycled for at least 46 hours before long-term life test begins for both temperatures. This is especially true when a small (surface-mount) part is wave soldered; allow time for stress relaxation to occur. The majority of the drift will occur in the first 1000 hours at elevated temperatures. The drift after 1000 hours will not continue at the first 1000 hour rate.
(7) Regulation is measured at constant junction temperature, using pulse testing with a low duty cycle. Changes in output due to heating effects can be computed by multiplying the internal dissipation by the thermal resistance