ZHCSIK7C July 2018 – June 2025 ESD321
PRODUCTION DATA
Figure 5-1 TLP I-V Curve, I/O Pin to
GND (tp = 100ns)
Figure 5-3 8kV IEC 61000-4-2
Clamping Voltage Waveform, I/O Pin to GND
Figure 5-5 DC Voltage Sweep I-V Curve, I/O Pin to GND
Figure 5-7 Capacitance vs. Bias Voltage For Different Temperatures (°C)
Figure 5-9 Insertion Loss vs. Frequency
Figure 5-2 TLP I-V Curve, GND to I/O
Pin (tp = 100ns)
Figure 5-4 8kV IEC 61000-4-2
Clamping Voltage Waveform, GND to I/O Pin
Figure 5-8 Leakage Current (at 3.6V
Bias) Across Temperature, I/O Pin to GND