SLVK235 September   2025 CDCLVP111-SEP

1.   1
2.   Abstract
3.   Trademarks
4. 1Introduction
5. 2Single-Event Effects (SEE)
6. 3Device and Test Board Information
7. 4Irradiation Facility and Setup
8. 5LETEFF and Range Calculation
9. 6Test Setup and Procedures
10. 7Destructive Single-Event Effects (DSEE)
    1. 7.1 Single-Event Latch-up (SEL) Results
11. 8Single-Event Transients (SET)
12. 9Summary
13.   A References