ZHCSO53G August 2010 – June 2021 TPD2EUSB30 , TPD2EUSB30A , TPD4EUSB30
PRODUCTION DATA
- 1 特性
- 2 應(yīng)用
- 3 說(shuō)明
- 4 Revision History
- 5 Pin Configuration and Functions
- 6 Specifications
- 7 Detailed Description
- 8 Application and Implementation
- 9 Power Supply Recommendations
- 10Layout
- 11Device and Documentation Support
- 12Mechanical, Packaging, and Orderable Information
封裝選項(xiàng)
機(jī)械數(shù)據(jù) (封裝 | 引腳)
- DRT|3
散熱焊盤(pán)機(jī)械數(shù)據(jù) (封裝 | 引腳)
- DRT|3
訂購(gòu)信息
8.2 Typical Application
This application describes a TPDxEUSB30/A eye pattern test. Figure 10-2 shows the lab board that was designed to demonstrate the degradation of the eye pattern quality with and without the TPD2EUSB30/A in the USB 3.0 signal path. The measurements show that there is only ~2 ps jitter penalty to the differential signal when the TPD2EUSB30/A device is added in the signal path. A similar setup was employed to measure the eye diagram for the TPD4EUSB30.
Figure 8-1 Measurement Setup to collect the Eye Pattern on a Reference Board with TPD2EUSB30/A
Figure 8-2 Measurement Setup to collect the Eye Pattern on a Reference Board with TPD2EUSB30/A