ZHCSGQ0A September 2017 – February 2022 TIC10024-Q1
PRODUCTION DATA
| MIN | NOM | MAX | UNIT | |||
|---|---|---|---|---|---|---|
| SWITCH MONITORING, INTERRUPT, STARTUP AND RESET | ||||||
| tPOLL_ACT | Polling active time accuracy | Polling mode | -12% | 12% | ||
| tPOLL | Polling time accuracy | Polling mode | -12% | 12% | ||
| tCOMP | Comparator detection time | 18 | μs | |||
| tCCP_TRAN | Transition time between last input sampling and start of clean current | 20 | μs | |||
| tCCP_ACT | Clean current active time | -12% | 12% | |||
| tSTARTUP | Polling startup time | 200 | 300 | 400 | μs | |
| tINT_ACTIVE | Active INT assertion duration | 1.5 | 2 | 2.5 | ms | |
| tINT_INACTIVE | INT de-assertion duration during a pending interrupt | 3 | 4 | 5 | ms | |
| tINT_IDLE | Interrupt idle time | 80 | 100 | 120 | μs | |
| tRESET | Time required to keep the RESET pin high to successfully reset the device (no pending interrupt)(1) | 2 | μs | |||
| tREACT | Delay between a fault event (OV, UV, TW, or TSD) to a high to low transition on the INT pin | See Figure 7-2 for OV example. | 20 | μs | ||
| SPI INTERFACE | ||||||
| tLEAD | Falling edge of CS to rising edge of SCLK setup time | 100 | ns | |||
| tLAG | Falling edge of SCLK to rising edge of CS setup time | 100 | ns | |||
| tSU | SI to SCLK falling edge setup time | 30 | ns | |||
| tHOLD | SI hold time after falling edge of SCLK | 20 | ns | |||
| tVALID | Time from rising edge of SCLK to valid SO data | 70 | ns | |||
| tSO(EN) | Time from falling edge of CS to SO low-impedance | 60 | ns | |||
| tSO(DIS) | Time from rising edge of CS to SO high-impedance | Loading of 1 k? to GND. See Figure 7-3. | 60 | ns | ||
| tR | SI, CS, and SCLK signals rise time | 5 | 30 | ns | ||
| tF | SI, CS, and SCLK signals fall time | 5 | 30 | ns | ||
| tINTER_FRAME | Delay between two SPI communication ( CS low) sequences | 1.5 | μs | |||
| tCKH | SCLK High time | 120 | ns | |||
| tCKL | SCLK Low time | 120 | ns | |||
| tINITIATION | Delay between valid VDD voltage and initial SPI communication | 45 | μs | |||