ZHCSGQ0A September 2017 – February 2022 TIC10024-Q1
PRODUCTION DATA
- 1 特性
- 2 應用
- 3 說明
- 4 Revision History
- 5 Pin Configuration and Functions
- 6 Specifications
- 7 Parameter Measurement Information
-
8 Detailed Description
- 8.1 Overview
- 8.2 Functional Block Diagram
- 8.3
Feature Description
- 8.3.1 VS Pin
- 8.3.2 VDD Pin
- 8.3.3 Device Initialization
- 8.3.4 Device Trigger
- 8.3.5 Device Reset
- 8.3.6 VS Under-Voltage (UV) Condition
- 8.3.7 VS Over-Voltage (OV) Condition
- 8.3.8 Switch Inputs Settings
- 8.3.9 Interrupt Generation and INT Assertion
- 8.3.10 Temperature Monitor
- 8.3.11 Parity Check And Parity Generation
- 8.3.12 Cyclic Redundancy Check (CRC)
- 8.4 Device Functional Modes
- 9 Programming
- 10Application and Implementation
- 11Power Supply Recommendations
- 12Layout
- 13Device and Documentation Support
- 14Mechanical, Packaging, and Orderable Information
10.3.1 Using TIC10024-Q1 in a 12 V Automotive System
Figure 10-3 Typical System Diagram of Battery Connections for TIC10024-Q1The TIC10024-Q1 is designed to operate with a 12 V automotive system. Figure 10-3 depicts a typical system diagram to show how the device is connected to the battery. Please remember to be careful when connecting the battery directly to the device on the VS supply pin (through a reverse-blocking diode) or the input (INX) pins since an automotive battery can be subjected to various transient and over-voltage events. Manufacturers have independently created standards and test procedures in an effort to prevent sensitive electronics from failing due to these events. Recently, combined efforts are made with ISO to develop the ISO 16750-2 standard (Road vehicles -- Environmental conditions and testing for electrical and electronic equipment -- Part 2: Electrical loads), which describe the possible transients that could occur to an automotive battery and specify test methods to simulate them.
It shall be noted that the TIC10024-Q1 is designed and tested according to the ISO 16750-2 standard. A few voltage stress tests and their test conditions are listed below. Exposing the device to more severe transient events than described by the standard can potentially causes performance degradation and long-term damage to the device.
- Direct current supply voltage: VBAT, min = 6 V; VBAT, max= 16 V
- To emulate a jump start event, voltage profile described in Figure 10-4 is used.
Figure 10-4 Voltage Profile to Test a Jump
Start Event| Parameter | Value |
|---|---|
| VBAT, min | 10.8 V |
| VBAT, max | 24 V |
| tr | < 10 ms |
| t1 | 60 s ± 6 s |
| tf | < 10 ms |
| Number of cycles | 1 |
To emulate a load dump event for an alternator with centralized load dump suppression, voltage profile described in Figure 10-5 is used. UA and US* are applied directly to VBAT.
| Parameter | Value |
|---|---|
| UA | 13.5 V |
| US | 79 V ≤ US ≤ 101 |
| US* | 35 V |
| td | 40 ms ≤ td ≤ 400 ms |
| tr | < 10 ms |
| Number of cycles | 5 pulses at intervals of 1 min |
To emulate a cranking event, voltage profile describe in Figure 10-6 is used. US, US6, and UA are applied directly to VBAT.
| Parameter | Value - Level I | Value - Level II | Value - Level IV |
|---|---|---|---|
| US6 | 8 V | 4.5 V | 6 V |
| US | 9.5 V | 6.5 V | 6.5 V |
| UB | 14 V ± 0.2 V | 14 V ± 0.2 V | 14 V ± 0.2 V |
| tf | 5 ms ± 0.5 ms | 5 ms ± 0.5 ms | 5 ms ± 0.5 ms |
| t6 | 15 ms ± 1.5 ms | 15 ms ± 1.5 ms | 15 ms ± 1.5 ms |
| t7 | 50 ms ± 5 ms | 50 ms ± 5 ms | 50 ms ± 5 ms |
| t8 | 1000 ms ± 100 ms | 10000 ms ± 1000 ms | 10000 ms ± 1000 ms |
| tr | 40 ms ± 4 ms | 100 ms ± 10 ms | 100 ms ± 10 ms |