ZHCSDY5C July 2015 – July 2024 TUSB4041I-Q1
PRODUCTION DATA
- 1
- 1 特性
- 2 應用
- 3 說明
- 4 Pin Configuration and Functions
- 5 Specifications
- 6 Detailed Description
-
7 Application and Implementation
- 7.1 Application Information
- 7.2
Typical Application
- 7.2.1 Design Requirements
- 7.2.2
Detailed Design Procedure
- 7.2.2.1 Upstream Port Implementation
- 7.2.2.2 Downstream Port 1 Implementation
- 7.2.2.3 Downstream Port 2 Implementation
- 7.2.2.4 Downstream Port 3 Implementation
- 7.2.2.5 Downstream Port 4 Implementation
- 7.2.2.6 VBUS Power Switch Implementation
- 7.2.2.7 Clock, Reset, and Miscellaneous
- 7.2.2.8 TUSB4041I-Q1 Power Implementation
- 7.2.3 Application Curves
- 7.3 Power Supply Recommendations
- 7.4 Layout
-
8 Register Maps
- 8.1 Configuration Registers
- 8.2 ROM Signature Register
- 8.3 Vendor ID LSB Register
- 8.4 Vendor ID MSB Register
- 8.5 Product ID LSB Register
- 8.6 Product ID MSB Register
- 8.7 Device Configuration Register
- 8.8 Battery Charging Support Register
- 8.9 Device Removable Configuration Register
- 8.10 Port Used Configuration Register
- 8.11 Device Configuration Register 2
- 8.12 USB 2.0 Port Polarity Control Register
- 8.13 UUID Byte N Register
- 8.14 Language ID LSB Register
- 8.15 Language ID MSB Register
- 8.16 Serial Number String Length Register
- 8.17 Manufacturer String Length Register
- 8.18 Product String Length Register
- 8.19 Serial Number String Registers
- 8.20 Manufacturer String Registers
- 8.21 Product String Byte N Register
- 8.22 Additional Feature Configuration Register
- 8.23 Device Status and Command Register
- 9 Device and Documentation Support
- 10Revision History
- 11Mechanical, Packaging, and Orderable Information
9.5 靜電放電警告
 |
靜電放電 (ESD) 會損壞這個集成電路。德州儀器 (TI) 建議通過適當的預防措施處理所有集成電路。如果不遵守正確的處理和安裝程序，可能會損壞集成電路。 |
| ESD 的損壞小至導致微小的性能降級，大至整個器件故障。精密的集成電路可能更容易受到損壞，這是因為非常細微的參數更改都可能會導致器件與其發布的規格不相符。 |