4 修訂歷史記錄
Changes from A Revision (February 2018) to B Revision
- Added 添加了新的 RTK (VQFNP) 封裝和相關內容Go
- Changed plots at IOUT > 2 A in Typical Characteristics section to match values shown in Specifications sectionGo
- Changed all IOUT test conditions from 3 A to 2 A to match values shown in Specifications sectionGo
- Changed all plots to use default COUT = 22 µFGo
- Changed Figure 48 to load transient plotGo
- Changed Figure 49 to noise plotGo
Changes from * Revision (September 2017) to A Revision
- Changed 從產品預覽更改為生產數據（有效）Go