|
VALUE |
UNIT |
| V(ESD)
(1)
|
Electrostatic discharge |
Human-body model
(HBM), per AEC Q100-002(2)
|
±2000 |
V |
| Charged-device
model (CDM), per AEC Q100-011, all pins (3) |
±500 |
| V(ESD)
(1)
|
Electrostatic
discharge |
Charged-device
model (CDM), per AEC Q100-011, corner pins (3)
|
±750 |
V |
(1) Electrostatic discharge (ESD) to measure device sensitivity and immunity
to damage caused by assembly line electrostatic discharges in to the device.
(2) Level listed above is the passing level per ANSI, ESDA, and JEDEC JS-001.
JEDEC document JEP155 states that 500-V HBM allows safe manufacturing with a standard ESD
control process. Manufacturing with less than 500-V HBM is possible with the necessary
precautions.
(3) Level listed above is the passing level per EIA-JEDEC JESD22-C101. JEDEC
document JEP157 states that 250-V CDM allows safe manufacturing with a standard ESD control
process. Manufacturing with less than 250-V CDM is possible with the necessary precautions.