ZHCSMZ5D April 2020 – January 2023 TLV841
PRODUCTION DATA
| PARAMETER | TEST CONDITIONS | MIN | TYP | MAX | UNIT | ||
|---|---|---|---|---|---|---|---|
| tP_HL | Propagation detect delay for VDD falling below VIT– | VDD = (VIT+ + 10%) to (VIT– – 10%) (2) | 30 | 50 | μs | ||
| tD | Reset time delay (TLV841C variant) | CT pin = Open or NC | 40 | 80 | μs | ||
| CT pin = 10 nF | 6.2 | ms | |||||
| CT pin = 1 μF | 619 | ms | |||||
| tD | Reset time delay (TLV841S and TLV841M variant) (5) | Variant A (3) | 40 | 80 | μs | ||
| Variant B (3) | 2 | ms | |||||
| Variant C (3) | 10 | ms | |||||
| Variant D (3) | 30 | ms | |||||
| Variant E (3) | 50 | ms | |||||
| Variant F (3) | 80 | ms | |||||
| Variant G (3) | 100 | ms | |||||
| Variant H (3) | 150 | ms | |||||
| Variant I (3) | 200 | ms | |||||
| tGI_VIT– | Glitch immunity VIT– |
5% VIT– overdrive (4) |
10 | μs | |||
| tSTRT | Startup Delay (1) | 300 | μs | ||||
| t MR_RES | Propagation delay from MR low to reset | VDD = 3.3 V, MR < V MR_L | tP_HL | μs | |||
| t MR_tD | Delay from release MR to deassert reset | VDD = 3.3 V, MR = V MR_L to V MR_H |
tD | ms | |||
| t MR_PW | Glitch immunity MR pin | 10 | μs | ||||