ZHCSH84A September 2017 – December 2017 SN55HVD233-SP
PRODUCTION DATA.
| PARAMETER | TEST CONDITIONS | SUBGROUP(2) | MIN | TYP(1) | MAX | UNIT | ||
|---|---|---|---|---|---|---|---|---|
| t(LBK) | Loopback delay, driver input to receiver output | See Figure 22 | 7.5 | ns | ||||
| t(loop1) | Total loop delay, driver input to receiver output, recessive to dominant | V(RS) at 0 V, see Figure 21 | [9, 10, 11] | 70 | 150 | ns | ||
| V(RS) with 10 kΩ to ground, see Figure 21 | [9, 10, 11] | 105 | 225 | |||||
| V(RS) with 50 kΩ to ground, see Figure 21 | [9, 10, 11] | 500 | 600 | |||||
| t(loop2) | Total loop delay, driver input to receiver output, dominant to recessive | V(RS) at 0 V, See Figure 21 | [9, 10, 11] | 70 | 150 | ns | ||
| V(RS) with 10 kΩ to ground, see Figure 21 | [9, 10, 11] | 105 | 225 | |||||
| V(RS) with 50 kΩ to ground, see Figure 21 | [9, 10, 11] | 500 | 600 | |||||
| SUBGROUP | DESCRIPTION | TEMPERATURE (°C) |
|---|---|---|
| 1 | Static tests at | 25 |
| 2 | Static tests at | 125 |
| 3 | Static tests at | –55 |
| 4 | Dynamic tests at | 25 |
| 5 | Dynamic tests at | 125 |
| 6 | Dynamic tests at | –55 |
| 7 | Functional tests at | 25 |
| 8A | Functional tests at | 125 |
| 8B | Functional tests at | –55 |
| 9 | Switching tests at | 25 |
| 10 | Switching tests at | 125 |
| 11 | Switching tests at | –55 |