1 Overview

This document contains information for LM5156, LM5156-Q1, LM51561, LM51561-Q1 (WSON), LM5156H, LM5156H-Q1, LM51561H, LM51561H-Q1, and LM34966-Q1 (HTSSOP) to aid in a functional safety system design. Information provided are:

• Functional Safety Failure In Time (FIT) rates of the semiconductor component estimated by the application of industry reliability standards
• Component failure modes and their distribution (FMD) based on the primary function of the device

Figure 1-1 and Figure 1-2 show the device functional block diagrams for reference.

Figure 1-1 Functional Block Diagram (LM5156xH, LM5156xH-Q1)

Figure 1-2 Functional Block Diagram (LM34966-Q1)

The LM5156, LM5156-Q1, LM51561, LM51561-Q1, LM5156H, LM5156H-Q1, LM51561H, LM51561H-Q1, and LM34966-Q1 were developed using a quality-managed development process, but were not developed in accordance with the IEC 61508 or ISO 26262 standards.