SLVK199 August 2025 TPS7H3024-SP
The primary focus of SETs were heavy-ion-induced transient upsets on RESET1, RESET4, PWRGD, or WDO. SET testing was done at room temperature using 165Ho which produced a LETEFF of 75MeV·cm2/mg. The output signals were monitored by four NI PXIe-5172. The PXIe-5172 was triggered with an edge-negative at –20% below the high voltage when in the on state. During the testing when the device was in the off state, the trigger was set to 0.66V with an edge-positive trigger.
The PXIe-5172 sample rate was set to 100MS/s with a record length of 100k points (or samples). The device was configured with an external voltage was controlled to provide an overdrive voltage of ±20mV (typically). The device was tested under the following conditions.
The device was tested under a typical voltage for IN (3.3V) and PULL_UPx (1.8V). Under these configurations not a single transient was recorded on all signals. This demonstrates the TPS7H3024-SP is SET and SEFI-free. The SET test conditions and results for three units are shown in Table 8-3.
| RUN # | UNIT # | FACILITY | ION | LETEFF (MeV·cm2/mg) | FLUX (ions/(cm2·s)) | FLUENCE (ions/cm2) | WD_IN (Hz) | On/Off | PXIe-5172 RESET 1(# OF TRANSIENTS | PXIe-5172 RESET 4(# OF TRANSIENTS | PXIe-5172 WDO (# OF TRANSIENTS) | PXIe-5172 PWRGD (# OF TRANSIENTS) |
|---|---|---|---|---|---|---|---|---|---|---|---|---|
13 | 5 | TAMU | 165Ho | 75 | 9.53 × 104 | 1.00 × 107 | 100k | On | 0 | 0 | 0 | 0 |
14 | 5 | TAMU | 165Ho | 75 | 9.25 × 104 | 1.00 × 107 | 0 | On | 0 | 0 | 0 | 0 |
15 | 5 | TAMU | 165Ho | 75 | 8.96 × 104 | 1.00 × 107 | 100k | Off | 0 | 0 | 0 | 0 |
16 | 6 | TAMU | 165Ho | 75 | 8.00 × 104 | 1.00 × 107 | 100k | On | 0 | 0 | 0 | 0 |
17 | 6 | TAMU | 165Ho | 75 | 8.00 × 104 | 1.00 × 107 | 0 | On | 0 | 0 | 0 | 0 |
18 | 6 | TAMU | 165Ho | 75 | 8.50 × 104 | 1.00 × 107 | 100k | Off | 0 | 0 | 0 | 0 |