10 Summary

The purpose of this study was to characterize the effect of heavy-ion irradiation on the single-event effect (SEE) performance of the TPS7H3024-SP. Heavy-ions with LET_EFF = 75MeV·cm²/mg were used for the SEE characterization campaign. Flux of ≈6 × 10⁴ to ≈1× 10⁵ ions/cm²·s and fluences of ≈10⁷ ions/cm² per run were used for the characterization. The SEE results demonstrated that the TPS7H3024-SP is free of destructive SEL and SEB/SEGR. The device also shown to be SET and SEFI-free at LET_EFF = 75MeV·cm²/mg and across the full electrical specifications. CREME96-based worst-week event-rate calculations for LEO (ISS) and GEO orbits for the DSEE and SET are presented for reference.