SLVK199 August 2025 TPS7H3024-SP
- 1
- TPS7H3024-SP Single-Event Effects (SEE)
- Trademarks
- 1 Introduction
- 2 Single-Event Effects (SEE)
- 3 Device and Test Board Information
- 4 Irradiation Facility and Setup
- 5 LETEFF and Range Calculation
- 6 Test Setup and Procedures
- 7 Destructive Single-Event Effects (DSEE)
- 8 Single-Event Transients (SET)
- 9 Event Rate Calculations
- 10Summary
- A References
3 Device and Test Board Information
The TPS7H3024-SP is packaged in a 22-pin CFP-HFT ceramic package as shown in Figure 3-1. The TPS7H3024EVM-CVAL was used to evaluate the performance and characteristics of the TPS7H3024-SP under heavy ion radiation. The TPS7H3024EVM-CVAL is shown in Figure 3-2. The configuration used during the heavy-ions test campaign in provided in Figure 3-3.
![Photograph of Delidded TPS7H3024-SP [Left] and Pinout Diagram [Right]](/ods/images/SLVK199/GUID-20250701-SS0I-1M3P-NSXI-6TQ2HU6Y4NG9-low.svg "Photograph of Delidded TPS7H3024-SP [Left] and Pinout Diagram [Right]")
Figure 3-1 Photograph of Delidded TPS7H3024-SP [Left] and Pinout Diagram [Right]Note: The package was delidded to reveal the die face for all heavy-ion testing.
Figure 3-2 TPS7H3024EVM-CVAL Top View
Figure 3-3 TPS7H3024EVM-CVAL Schematic for SEE Testing