Abstract

This report discusses the radiation characterization results of the DRV8351-SEP. The study was done to determine total ionizing dose (TID) effects under high dose rate (HDR) up to 30krad(Si) as a one time characterization. The results show that all samples passed within the specified limits up to 30krad(Si). Radiation Lot Acceptance Testing (RLAT) are performed using five units at a dose level of 30krad(Si) for future wafer lots per MIL-STD-883 TM 1019.

The DRV8351-SEP is packaged in a space enhanced plastic for low outgassing characteristics and is Single Event Latch-Up (SEL) immune up to 43MeV-cm² / mg, which makes the device an option for low Earth orbit space applications.

The DRV8351-SEP Total Ionizing Dose (TID) Report covers the TID performance.