SFFSAJ9A June 2025 – September 2025 UCC27289
This section provides functional safety failure in time (FIT) rates for the SOIC package of UCC27289 based on two different industry-wide used reliability standards:
| FIT IEC TR 62380 / ISO 26262 | Power Dissipation (mW) | FIT (Failures Per 109 Hours) |
|---|---|---|
| Total component FIT rate | 10 | 13 |
| 100 | 14 | |
| 500 | 28 | |
| Die FIT rate | 10 | 2 |
| 100 | 3 | |
| 500 | 14 | |
| Package FIT rate | 10 | 11 |
| 100 | 11 | |
| 500 | 14 |
The failure rate and mission profile information in Table 2-1 comes from the reliability data handbook IEC TR 62380 / ISO 26262 part 11:
| Table | Category | Reference FIT Rate | Reference Virtual TJ |
|---|---|---|---|
| 5 | CMOS, BICMOS, Digital, analog, or mixed |
20 FIT | 55°C |
The reference FIT rate and reference virtual TJ (junction temperature) in Table 2-4 come from the Siemens Norm SN 29500-2 tables 1 through 5. Failure rates under operating conditions are calculated from the reference failure rate and virtual junction temperature using conversion information in SN 29500-2 section 4.