SETs are defined as heavy-ion-induced transients upsets on V_OUT of the THVD9491-SEP. The species used for the SET testing was a Silver (Ag), a Krypton (Kr) and an Argon (Ar) with an angle-of-incidence of 0° for an LET_EFF of 47.5, 30.1 and 8.54MeV-cm²/mg respectively. Flux of approximately 10⁴ions/cm² × s and a fluence of approximately 10⁶ions/cm² were used for all runs of SET testing. V_OUT SETs were characterized using a window trigger of ±10% around the nominal output voltage. The devices were characterized in two different voltage cases. The first used a 3.3V VCC, 1.8V VIO and 6V A pin voltage. The second used a 5.5V VCC, 5.5V VIO and 12V A pin voltage. Both bias schemes used a NI PXIe-5172 to monitor the R pin as output. The scope triggering from V_OUT was programmed to record 150 samples for both schemes with a constant sample rate of 100 mega-samples per second (MS/s) in case of an event. The scope was programmed to record 20% of the data before the trigger. Under heavy-ions, the THVD9491-SEP exhibits transient upsets that were fully recoverable without the need for external intervention. Test conditions and results are shown below in Table 5-3.

Using the MFTF method, the upper-bound cross section (using a 95% confidence level) is calculated for the different SETs as shown below.