SBOK061 October 2022 SN54SLC8T245-SEP
The purpose of this study was to characterize the effect of heavy-ion irradiation on the single-event effect (SEE) performance of the SN54SLC8T245-SEP 8-bit dual-supply bus transceiver. Heavy-ions with LETEFF = 43 MeV·cm2 /mg were were used for the SEE characterization campaign. The SEE results demonstrated that the SN54SLC8T245-SEP is free of destructive SET events and SEL-free up to LETEFF = 43 MeV·cm2 /mg and across the full electrical specifications. Transients at LETEFF = 43 MeV·cm2 /mg are presented and discussed. CREME96-based worst-week event-rate calculations for LEO (ISS) and GEO orbits for the DSEE are presented for reference.