ZHCSDC1D September 2013 – October 2018 TAS5766M , TAS5768M
PRODUCTION DATA.
| MIN | MAX | UNIT | |||
|---|---|---|---|---|---|
| tSCL | SCL clock frequency | Standard | 100 | kHz | |
| Fast | 400 | ||||
| tBUF | Bus free time between a STOP and START condition | Standard | 4.7 | µs | |
| Fast | 1.3 | ||||
| tLOW | Low period of the SCL clock | Standard | 4.7 | µs | |
| Fast | 1.3 | ||||
| tHI | High period of th eSCL clock | Standard | 4 | µs | |
| Fast | 0.6 | ||||
| tRS-SU | Setup time for (repeated) START condition | Standard | 4.7 | µs | |
| Fast | 0.6 | ||||
| tS-HD | Hold time for (repeated) START condition | Standard | 4 | µs | |
| tRS-HD | Fast | 0.6 | |||
| tD-SU | Data setup time | Standard | 0.25 | µs | |
| Fast | 0.1 | ||||
| tD-HD | Data hold time | Standard | 0 | 0.9 | µs |
| Fast | 0 | 0.9 | |||
| tSCL-R | Rise time of SCL signal | Standard | 20+ 0.1CB | 1 | µs |
| Fast | 20+ 0.1CB | 0.3 | |||
| tSCL-R1 | Rise time of SCL signal after a repeated START condition and after an acknowledge bit | Standard | 20+ 0.1CB | 1 | µs |
| Fast | 20+ 0.1CB | 0.3 | |||
| tSCL-F | Fall time of SCL signal | Standard | 20+ 0.1CB | 1 | µs |
| Fast | 20+ 0.1CB | 0.3 | |||
| tSDA-R | Rise time of SDA signal | Standard | 20+ 0.1CB | 1 | µs |
| Fast | 20+ 0.1CB | 0.3 | |||
| tSDA-F | Fall time of SDA signal | Standard | 20+ 0.1CB | 1 | µs |
| Fast | 20+ 0.1CB | 0.3 | |||
| tP-SU | Setup time for STOP condition | Standard | 4 | µs | |
| Fast | 0.6 | ||||
| CB | Capacitive load for SDA and SCL line | 400 | pF | ||
| tSP | Pulse width of spike suppressed | Fast | 50 | ns | |
| VNH | Noise margin at high level for each connected device (including hysteresis) | 0.2 VDD | V | ||
Figure 1. Register Access Timing