ZHCSJY0B June 2012 – June 2019 LMR12015 , LMR12020
PRODUCTION DATA.
Switching losses are also associated with the internal NFET. They occur during the switch on and off transition periods, where voltages and currents overlap resulting in power loss. The simplest means to determine this loss is to empirically measuring the rise and fall times (10% to 90%) of the switch at the switch node:
| VIN | tRISE | tFALL |
|---|---|---|
| 5 V | 8 ns | 8 ns |
| 10 V | 9 ns | 9ns |
| 15 V | 10 ns | 10 ns |