ZHCSM05 June 2020 LM51561H-Q1 , LM5156H-Q1
PRODUCTION DATA
- 1 特性
- 2 應用
- 3 說明
- 4 Revision History
- 5 說明（續）
- 6 Device Comparison Table
- 7 Pin Configuration and Functions
- 8 Specifications
-
9 Detailed Description
- 9.1 Overview
- 9.2 Functional Block Diagram
- 9.3
Feature Description
- 9.3.1 Line Undervoltage Lockout (UVLO/SYNC/EN Pin)
- 9.3.2 High Voltage VCC Regulator (BIAS, VCC Pin)
- 9.3.3 Soft Start (SS Pin)
- 9.3.4 Switching Frequency (RT Pin)
- 9.3.5 Dual Random Spread Spectrum (DRSS)
- 9.3.6 Clock Synchronization (UVLO/SYNC/EN Pin)
- 9.3.7 Current Sense and Slope Compensation (CS Pin)
- 9.3.8 Current Limit and Minimum On-time (CS Pin)
- 9.3.9 Feedback and Error Amplifier (FB, COMP Pin)
- 9.3.10 Power-Good Indicator (PGOOD Pin)
- 9.3.11 Hiccup Mode Overload Protection (LM51561H-Q1 Only)
- 9.3.12 Maximum Duty Cycle Limit and Minimum Input Supply Voltage
- 9.3.13 MOSFET Driver (GATE Pin)
- 9.3.14 Overvoltage Protection (OVP)
- 9.3.15 Thermal Shutdown (TSD)
- 9.4 Device Functional Modes
- 10Application and Implementation
- 11Power Supply Recommendations
- 12Layout
- 13Device and Documentation Support
- 14Mechanical, Packaging, and Orderable Information
13.5 靜電放電警告
 |
靜電放電 (ESD) 會損壞這個集成電路。德州儀器 (TI) 建議通過適當的預防措施處理所有集成電路。如果不遵守正確的處理和安裝程序，可能會損壞集成電路。 |
| ESD 的損壞小至導致微小的性能降級，大至整個器件故障。精密的集成電路可能更容易受到損壞，這是因為非常細微的參數更改都可能會導致器件與其發布的規格不相符。 |