ZHCSPX4A February 2022 – April 2022 LM5152-Q1 , LM51521-Q1
PRODUCTION DATA
- 1 特性
- 2 應用
- 3 說明
- 4 Revision History
- 5 說明（續）
- 6 Device Comparison Table
- 7 Pin Configuration and Functions
- 8 Specifications
-
9 Detailed Description
- 9.1 Overview
- 9.2 Functional Block Diagram
- 9.3
Feature Description
- 9.3.1 Device Enable/Disable (EN, VH Pin)
- 9.3.2 High Voltage VCC Regulator (BIAS, VCC Pin)
- 9.3.3 Light Load Switching Mode Selection (MODE Pin)
- 9.3.4 Line Undervoltage Lockout (UVLO Pin)
- 9.3.5 Fast Restart Using VCC HOLD (VH Pin)
- 9.3.6 Adjustable Output Regulation Target (VOUT, TRK, VREF Pin)
- 9.3.7 Overvoltage Protection (VOUT Pin)
- 9.3.8 Boost Status Indicator (STATUS Pin)
- 9.3.9 Dynamically Programmable Switching Frequency (RT)
- 9.3.10 External Clock Synchronization (SYNC Pin)
- 9.3.11 Programmable Spread Spectrum (DITHER Pin)
- 9.3.12 Programmable Soft Start (SS Pin)
- 9.3.13 Wide Bandwidth Transconductance Error Amplifier and PWM (TRK, COMP Pin)
- 9.3.14 Current Sensing and Slope Compensation (CSP, CSN Pin)
- 9.3.15 Constant Peak Current Limit (CSP, CSN Pin)
- 9.3.16 Maximum Duty Cycle and Minimum Controllable On-Time Limits
- 9.3.17 Deep Sleep Mode and Bypass Operation (HO, CP Pin)
- 9.3.18 MOSFET Drivers, Integrated Boot Diode, and Hiccup Mode Fault Protection (LO, HO, HB Pin)
- 9.3.19 Thermal Shutdown Protection
- 9.4 Device Functional Modes
- 10Application and Implementation
- 11Power Supply Recommendations
- 12Layout
- 13Device and Documentation Support
- 14Mechanical, Packaging, and Orderable Information
13.5 Electrostatic Discharge Caution
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This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with appropriate precautions. Failure to observe proper handling and installation procedures can cause damage. |
| ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more susceptible to damage because very small parametric changes could cause the device not to meet its published specifications. |