ZHCSD31H November 2014 – November 2024 ISO7821
PRODUCTION DATA
- 1
- 1 特性
- 2 應(yīng)用
- 3 說明
- 4 Pin Configuration and Functions
-
5 Specifications
- 5.1 Absolute Maximum Ratings
- 5.2 ESD Ratings
- 5.3 Recommended Operating Conditions
- 5.4 Thermal Information
- 5.5 Power Dissipation Characteristics
- 5.6 Electrical Characteristics, 5 V
- 5.7 Electrical Characteristics, 3.3 V
- 5.8 Electrical Characteristics, 2.5 V
- 5.9 Power Ratings
- 5.10 Insulation Specifications
- 5.11 Safety-Related Certifications
- 5.12 Safety Limiting Values
- 5.13 Switching Characteristics, 5 V
- 5.14 Switching Characteristics, 3.3 V
- 5.15 Switching Characteristics, 2.5 V
- 5.16 Typical Characteristics
- 6 Parameter Measurement Information
- 7 Detailed Description
- 8 Application and Implementation
- 9 Device and Documentation Support
- 10Revision History
- 11Mechanical, Packaging, and Orderable Information
封裝選項(xiàng)
請(qǐng)參考 PDF 數(shù)據(jù)表獲取器件具體的封裝圖。
機(jī)械數(shù)據(jù) (封裝 | 引腳)
- DWW|16
- DW|16
散熱焊盤機(jī)械數(shù)據(jù) (封裝 | 引腳)
訂購(gòu)信息
6 Parameter Measurement Information
A. The input pulse is supplied by a
generator having the following characteristics: PRR ≤ 50 kHz, 50% duty cycle,
tr ≤ 3 ns, tf ≤ 3ns, ZO = 50 Ω. At the
input, 50 Ω resistor is required to terminate Input Generator signal. The 50 Ω
resistor is not needed in actual application.
B. CL = 15 pF and
includes instrumentation and fixture capacitance within ±20%.
Figure 6-1 Switching
Characteristics Test Circuit and Voltage Waveforms
A. The input pulse is supplied by a
generator having the following characteristics: PRR ≤ 10 kHz, 50% duty cycle,
tr ≤ 3 ns, tf ≤ 3 ns, ZO = 50 Ω.
B. CL = 15 pF and
includes instrumentation and fixture capacitance within ±20%.
Figure 6-2 Enable/Disable Propagation Delay Time Test Circuit and Waveform
A. CL = 15 pF and
includes instrumentation and fixture capacitance within ±20%.
Figure 6-3 Default
Output Delay Time Test Circuit and Voltage Waveforms
A. CL = 15 pF and
includes instrumentation and fixture capacitance within ±20%.
Figure 6-4 Common-Mode Transient Immunity Test Circuit