產(chǎn)品詳情

Number of channels 2 Output type Push-Pull Propagation delay time (μs) 6 Vs (max) (V) 5.5 Vs (min) (V) 1.8 Rating HiRel Enhanced Product Features Hysteresis Iq per channel (typ) (mA) 0.00085 Vos (offset voltage at 25°C) (max) (mV) 15 Rail-to-rail In Operating temperature range (°C) -55 to 125 Input bias current (±) (max) (nA) 0.05 VICR (max) (V) 5.7 VICR (min) (V) -0.2
Number of channels 2 Output type Push-Pull Propagation delay time (μs) 6 Vs (max) (V) 5.5 Vs (min) (V) 1.8 Rating HiRel Enhanced Product Features Hysteresis Iq per channel (typ) (mA) 0.00085 Vos (offset voltage at 25°C) (max) (mV) 15 Rail-to-rail In Operating temperature range (°C) -55 to 125 Input bias current (±) (max) (nA) 0.05 VICR (max) (V) 5.7 VICR (min) (V) -0.2
SOIC (D) 8 29.4 mm2 4.9 x 6
  • Very Low Supply Current: 0.8 μA (Typical)
  • Input Common Mode Range 200 mV Beyond Supply Rails
  • Supply Voltage: 1.8 V to 5.5 V
  • High Speed: 6 μs
  • Push/Pull CMOS Output Stage
  • Controlled Baseline
    • One Assembly/Test Site, One Fabrication Site
  • Extended Temperature Performance of –55°C to 125°C
  • Enhanced Diminishing Manufacturing Sources (DMS) Support
  • Enhanced Product Change Notification
  • Qualification Pedigree
  • APPLICATIONS
    • Portable Medical Equipment
    • Wireless Security Systems
    • Remote Control Systems
    • Handheld Instruments
    • Ultra-Low Power Systems

Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits.
  • Very Low Supply Current: 0.8 μA (Typical)
  • Input Common Mode Range 200 mV Beyond Supply Rails
  • Supply Voltage: 1.8 V to 5.5 V
  • High Speed: 6 μs
  • Push/Pull CMOS Output Stage
  • Controlled Baseline
    • One Assembly/Test Site, One Fabrication Site
  • Extended Temperature Performance of –55°C to 125°C
  • Enhanced Diminishing Manufacturing Sources (DMS) Support
  • Enhanced Product Change Notification
  • Qualification Pedigree
  • APPLICATIONS
    • Portable Medical Equipment
    • Wireless Security Systems
    • Remote Control Systems
    • Handheld Instruments
    • Ultra-Low Power Systems

Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits.

The TLV349x family of push/pull output comparators features a fast 6µs response time and <1.2 µA (max) nanopower capability, allowing operation from 1.8 V to 5.5 V. Input common-mode range beyond supply rails make the TLV349x an ideal choice for low-voltage applications.

The TLV349x is excellent for power-sensitive, low-voltage (2-cell) applications.

The TLV349x family of push/pull output comparators features a fast 6µs response time and <1.2 µA (max) nanopower capability, allowing operation from 1.8 V to 5.5 V. Input common-mode range beyond supply rails make the TLV349x an ideal choice for low-voltage applications.

The TLV349x is excellent for power-sensitive, low-voltage (2-cell) applications.
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* 數(shù)據(jù)表 1.8 V, Nanopower, Push-Pull Output Comparators 數(shù)據(jù)表 2007年 4月 30日

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包含信息：
  • RoHS
  • REACH
  • 器件標(biāo)識(shí)
  • 引腳鍍層/焊球材料
  • MSL 等級(jí)/回流焊峰值溫度
  • MTBF/時(shí)基故障估算
  • 材料成分
  • 鑒定摘要
  • 持續(xù)可靠性監(jiān)測(cè)
包含信息：
  • 制造廠地點(diǎn)
  • 封裝廠地點(diǎn)