SN74LV4051A-EP

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5V 8:1 單通道通用模擬多路復(fù)用器（增強(qiáng)型產(chǎn)品）

產(chǎn)品詳情

Configuration 8:1 Number of channels 1 Power supply voltage - single (V) 1.8, 2.5, 3.3, 5 Protocols Analog Ron (typ) (Ω) 22 CON (typ) (pF) 23.4 ON-state leakage current (max) (μA) 1 Bandwidth (MHz) 35 Operating temperature range (°C) -40 to 105 Input/output continuous current (max) (A) 0.025 Rating HiRel Enhanced Product Drain supply voltage (max) (V) 5.5 Supply voltage (max) (V) 5.5
Configuration 8:1 Number of channels 1 Power supply voltage - single (V) 1.8, 2.5, 3.3, 5 Protocols Analog Ron (typ) (Ω) 22 CON (typ) (pF) 23.4 ON-state leakage current (max) (μA) 1 Bandwidth (MHz) 35 Operating temperature range (°C) -40 to 105 Input/output continuous current (max) (A) 0.025 Rating HiRel Enhanced Product Drain supply voltage (max) (V) 5.5 Supply voltage (max) (V) 5.5
SOIC (D) 16 59.4 mm2 9.9 x 6 TSSOP (PW) 16 32 mm2 5 x 6.4
  • Controlled Baseline
    • One Assembly/Test Site, One Fabrication Site
  • Extended Temperature Performance of –40°C to 105°C
  • Enhanced Diminishing Manufacturing Sources (DMS) Support
  • Enhanced Product-Change Notification
  • Qualification Pedigree
  • 2-V to 5.5-V VCC Operation
  • Support Mixed-Mode Voltage Operation on All Ports
  • High On-Off Output-Voltage Ratio
  • Low Crosstalk Between Switches
  • Individual Switch Controls
  • Extremely Low Input Current
  • Latch-Up Performance Exceeds 100 mA Per JESD 78, Class II
  • ESD Protection Exceeds JESD 22
    • 2000-V Human-Body Model (A114-A)
    • 200-V Machine Model (A115-A)
    • 1000-V Charged-Device Model (C101)

Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits.
  • Controlled Baseline
    • One Assembly/Test Site, One Fabrication Site
  • Extended Temperature Performance of –40°C to 105°C
  • Enhanced Diminishing Manufacturing Sources (DMS) Support
  • Enhanced Product-Change Notification
  • Qualification Pedigree
  • 2-V to 5.5-V VCC Operation
  • Support Mixed-Mode Voltage Operation on All Ports
  • High On-Off Output-Voltage Ratio
  • Low Crosstalk Between Switches
  • Individual Switch Controls
  • Extremely Low Input Current
  • Latch-Up Performance Exceeds 100 mA Per JESD 78, Class II
  • ESD Protection Exceeds JESD 22
    • 2000-V Human-Body Model (A114-A)
    • 200-V Machine Model (A115-A)
    • 1000-V Charged-Device Model (C101)

Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits.

This 8-channel CMOS analog multiplexer/demultiplexer is designed for 2-V to 5.5-V VCC operation.

The SN74LV4051A handles both analog and digital signals. Each channel permits signals with amplitudes up to 5.5 V (peak) to be transmitted in either direction.

Applications include signal gating, chopping, modulation or demodulation (modem), and signal multiplexing for analog-to-digital and digital-to-analog conversion systems.

This 8-channel CMOS analog multiplexer/demultiplexer is designed for 2-V to 5.5-V VCC operation.

The SN74LV4051A handles both analog and digital signals. Each channel permits signals with amplitudes up to 5.5 V (peak) to be transmitted in either direction.

Applications include signal gating, chopping, modulation or demodulation (modem), and signal multiplexing for analog-to-digital and digital-to-analog conversion systems.
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類型 標(biāo)題 下載最新的英語(yǔ)版本 日期
* 數(shù)據(jù)表 SN74LV4051A-EP 數(shù)據(jù)表 (Rev. D) 2004年 5月 11日
* VID SN74LV4051A-EP VID V6203664 2016年 6月 21日
應(yīng)用手冊(cè) 選擇正確的德州儀器 (TI) 信號(hào)開關(guān) (Rev. E) PDF | HTML 英語(yǔ)版 (Rev.E) PDF | HTML 2022年 8月 5日
應(yīng)用手冊(cè) 多路復(fù)用器和信號(hào)開關(guān)詞匯表 (Rev. B) 英語(yǔ)版 (Rev.B) PDF | HTML 2022年 3月 11日

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封裝 引腳 CAD 符號(hào)、封裝和 3D 模型
SOIC (D) 16 Ultra Librarian
TSSOP (PW) 16 Ultra Librarian

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  • RoHS
  • REACH
  • 器件標(biāo)識(shí)
  • 引腳鍍層/焊球材料
  • MSL 等級(jí)/回流焊峰值溫度
  • MTBF/時(shí)基故障估算
  • 材料成分
  • 鑒定摘要
  • 持續(xù)可靠性監(jiān)測(cè)
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  • 制造廠地點(diǎn)
  • 封裝廠地點(diǎn)

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