產(chǎn)品詳情

Number of channels 1 Output type Open-collector, Open-drain Propagation delay time (μs) 0.115 Vs (max) (V) 30 Vs (min) (V) 3.5 Rating HiRel Enhanced Product Features Strobe, Vos Adj Pin Iq per channel (typ) (mA) 5.1 Vos (offset voltage at 25°C) (max) (mV) 3 Rail-to-rail No Operating temperature range (°C) -55 to 125 Input bias current (±) (max) (nA) 100 VICR (max) (V) 28 VICR (min) (V) 0.5
Number of channels 1 Output type Open-collector, Open-drain Propagation delay time (μs) 0.115 Vs (max) (V) 30 Vs (min) (V) 3.5 Rating HiRel Enhanced Product Features Strobe, Vos Adj Pin Iq per channel (typ) (mA) 5.1 Vos (offset voltage at 25°C) (max) (mV) 3 Rail-to-rail No Operating temperature range (°C) -55 to 125 Input bias current (±) (max) (nA) 100 VICR (max) (V) 28 VICR (min) (V) 0.5
SOIC (D) 8 29.4 mm2 4.9 x 6
  • Controlled Baseline
    • One Assembly/Test Site, One Fabrication Site
  • Extended Temperature Performance of -55°C to 125°C
  • Enhanced Diminishing Manufacturing Sources (DMS) Support
  • Enhanced Product Change Notification
  • Qualification Pedigree(1)
  • Fast Response Times
  • Strobe Capability
  • Maximum Input Bias Current . . . 300 nA
  • Maximum Input Offset Current . . . 70 nA
  • Can Operate From Single 5-V Supply

(1)Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold-compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits.
  • Controlled Baseline
    • One Assembly/Test Site, One Fabrication Site
  • Extended Temperature Performance of -55°C to 125°C
  • Enhanced Diminishing Manufacturing Sources (DMS) Support
  • Enhanced Product Change Notification
  • Qualification Pedigree(1)
  • Fast Response Times
  • Strobe Capability
  • Maximum Input Bias Current . . . 300 nA
  • Maximum Input Offset Current . . . 70 nA
  • Can Operate From Single 5-V Supply

(1)Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold-compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits.

The LM211-EP is a single high-speed voltage comparator. This device is designed to operate from a wide range of power-supply voltages, including ±15-V supplies for operational amplifiers and 5-V supplies for logic systems. The output levels are compatible with most TTL and MOS circuits. This comparator is capable of driving lamps or relays and switching voltages up to 50 V at 50 mA. All inputs and outputs can be isolated from system ground. The outputs can drive loads referenced to ground, VCC+ or VCC-. Offset balancing and strobe capabilities are available, and the outputs can be wired-OR connected. If the strobe is low, the output is in the off state, regardless of the differential input.

The LM211-EP is a single high-speed voltage comparator. This device is designed to operate from a wide range of power-supply voltages, including ±15-V supplies for operational amplifiers and 5-V supplies for logic systems. The output levels are compatible with most TTL and MOS circuits. This comparator is capable of driving lamps or relays and switching voltages up to 50 V at 50 mA. All inputs and outputs can be isolated from system ground. The outputs can drive loads referenced to ground, VCC+ or VCC-. Offset balancing and strobe capabilities are available, and the outputs can be wired-OR connected. If the strobe is low, the output is in the off state, regardless of the differential input.
下載 觀看帶字幕的視頻 視頻

技術(shù)文檔

star =有關(guān)此產(chǎn)品的 TI 精選熱門(mén)文檔
未找到結(jié)果。請(qǐng)清除搜索并重試。
查看全部 4
頂層文檔 類型 標(biāo)題 格式選項(xiàng) 下載最新的英語(yǔ)版本 日期
* 數(shù)據(jù)表 LM211-EP 數(shù)據(jù)表 (Rev. A) 2006年 2月 22日
* VID LM211-EP VID V6203638 2016年 6月 21日
* 輻射與可靠性報(bào)告 LM211MDREP Reliability Report 2012年 5月 7日
電子書(shū) The Signal e-book: 有關(guān)運(yùn)算放大器設(shè)計(jì)主題的博客文章匯編 英語(yǔ)版 2018年 1月 31日

設(shè)計(jì)與開(kāi)發(fā)

如需其他信息或資源，請(qǐng)點(diǎn)擊以下任一標(biāo)題進(jìn)入詳情頁(yè)面查看（如有）。

評(píng)估板

AMP-PDK-EVM — 放大器高性能開(kāi)發(fā)套件評(píng)估模塊

放大器高性能開(kāi)發(fā)套件 (PDK) 是一款用于測(cè)試常見(jiàn)運(yùn)算放大器參數(shù)的評(píng)估模塊 (EVM) 套件，與大多數(shù)運(yùn)算放大器和比較器均兼容。該 EVM 套件提供了一個(gè)主板，主板上具有多個(gè)插槽式子卡選項(xiàng)以滿足封裝需求，使工程師能夠快速評(píng)估和驗(yàn)證器件性能。

AMP-PDK-EVM 套件支持五種常用的業(yè)界通用封裝，包括：

  • D（SOIC-8 和 SOIC-14）
  • PW (TSSOP-14)
  • DGK (VSSOP-8)
  • DBV（SOT23-5 和 SOT23-6）
  • DCK（SC70-5 和 SC70-6）
用戶指南: PDF | HTML
英語(yǔ)版 (Rev.B): PDF | HTML
View Options
模擬工具

PSPICE-FOR-TI — PSpice? for TI 設(shè)計(jì)和仿真工具

PSpice? for TI 可提供幫助評(píng)估模擬電路功能的設(shè)計(jì)和仿真環(huán)境。此功能齊全的設(shè)計(jì)和仿真套件使用 Cadence? 的模擬分析引擎。PSpice for TI 可免費(fèi)使用，包括業(yè)內(nèi)超大的模型庫(kù)之一，涵蓋我們的模擬和電源產(chǎn)品系列以及精選的模擬行為模型。

借助?PSpice for TI 的設(shè)計(jì)和仿真環(huán)境及其內(nèi)置的模型庫(kù)，您可對(duì)復(fù)雜的混合信號(hào)設(shè)計(jì)進(jìn)行仿真。創(chuàng)建完整的終端設(shè)備設(shè)計(jì)和原型解決方案，然后再進(jìn)行布局和制造，可縮短產(chǎn)品上市時(shí)間并降低開(kāi)發(fā)成本。?

在?PSpice for TI 設(shè)計(jì)和仿真工具中，您可以搜索 TI (...)
發(fā)送申請(qǐng)
模擬工具

TINA-TI — 基于 SPICE 的模擬仿真程序

TINA-TI 提供了 SPICE 所有的傳統(tǒng)直流、瞬態(tài)和頻域分析以及更多。TINA 具有廣泛的后處理功能，允許您按照希望的方式設(shè)置結(jié)果的格式。虛擬儀器允許您選擇輸入波形、探針電路節(jié)點(diǎn)電壓和波形。TINA 的原理圖捕獲非常直觀 - 真正的“快速入門(mén)”。

TINA-TI 安裝需要大約 500MB。直接安裝，如果想卸載也很容易。我們相信您肯定會(huì)愛(ài)不釋手。

TINA 是德州儀器 (TI) 專有的 DesignSoft 產(chǎn)品。該免費(fèi)版本具有完整的功能，但不支持完整版 TINA 所提供的某些其他功能。

如需獲取可用 TINA-TI 模型的完整列表，請(qǐng)參閱：SpiceRack - 完整列表 

需要 HSpice (...)

用戶指南: PDF
英語(yǔ)版 (Rev.A): PDF
View Options
封裝 引腳 CAD 符號(hào)、封裝和 3D 模型
SOIC (D) 8 Ultra Librarian

訂購(gòu)和質(zhì)量

包含信息：
  • RoHS
  • REACH
  • 器件標(biāo)識(shí)
  • 引腳鍍層/焊球材料
  • MSL 等級(jí)/回流焊峰值溫度
  • MTBF/時(shí)基故障估算
  • 材料成分
  • 鑒定摘要
  • 持續(xù)可靠性監(jiān)測(cè)
包含信息：
  • 制造廠地點(diǎn)
  • 封裝廠地點(diǎn)

推薦產(chǎn)品可能包含與 TI 此產(chǎn)品相關(guān)的參數(shù)、評(píng)估模塊或參考設(shè)計(jì)。

支持和培訓(xùn)

可獲得 TI 工程師技術(shù)支持的 TI E2E? 論壇

所有內(nèi)容均由 TI 和社區(qū)貢獻(xiàn)者按“原樣”提供，并不構(gòu)成 TI 規(guī)范。請(qǐng)參閱使用條款。

如果您對(duì)質(zhì)量、包裝或訂購(gòu) TI 產(chǎn)品有疑問(wèn)，請(qǐng)參閱 TI 支持。??????????????

視頻