SNVA925E January 2020 – March 2024 LM63610-Q1 , LM63615-Q1 , LM63625-Q1
The failure mode distribution estimation for the LM636xx-Q1 in Table 3-1 comes from the combination of common failure modes listed in standards such as IEC 61508 and ISO 26262, the ratio of sub-circuit function size and complexity and from best engineering judgment.
The failure modes listed in this section reflect random failure events and do not include failures due to misuse or overstress.
| Die Failure Modes | Failure Mode Distribution (%) |
|---|---|
| No output voltage | 35% |
| Output not in specification -- voltage or timing | 45% |
| SW driver FET stuck on | 10% |
| RESET false trip or fails to trip | 5% |
| Short circuit any two pins | 5% |