SLVK164 December 2023 TPS7H2211-SP
PRODUCTION DATA
HDR devices were stressed at 3 krad(Si), 10 krad(Si), 30 krad(Si), 50 krad (Si) and 100krad(Si) for biased and unbiased conditions.
| Total Samples: 25 | ||||
|---|---|---|---|---|
| Exposure Levels | ||||
| 3 krad(Si) | 10 krad(Si) | 30 krad(Si) | 50 krad(Si) | 100 krad(Si) |
| 1, 2, 3, 4, 5 | 11, 12, 13, 14, 15 | 21, 22, 23, 24, 25 | 31, 32, 33, 34, 35 | 41, 42, 43, 44, 45 |
| Total Samples: 25 | ||||
|---|---|---|---|---|
| Exposure Levels | ||||
| 3 krad(Si) | 10 krad(Si) | 30 krad(Si) | 50 krad(Si) | 100 krad(Si) |
| 6, 7, 8, 9, 10 | 16, 17, 18, 19, 20 | 26, 27, 28, 29, 30 | 36, 37, 38, 39, 40 | 46, 47, 48, 49, 50 |