Abstract

This report presents the effect of neutron displacement damage (NDD) on the TPS7H2201-SEP device. The results show that all devices were fully functional and within production test limits after having been irradiated up to 1 × 10¹³ n/cm²[1-MeV(Si) equivalent]. A sample size of nine units were exposed per MIL-STD-883, Method 1017 for Neutron Irradiation, and an additional two devices were used as control units and were not irradiated. Electrical testing was performed at Texas Instruments before and after neutron irradiation using the production test program for TPS7H2201-SEP.