1 Overview

This document contains information for TPS62810-Q1, TPS62811-Q1, TPS62812-Q1, TPS62813-Q1 (VQFN package) to aid in a functional safety system design. Information provided are:

• Functional Safety Failure In Time (FIT) rates of the semiconductor component estimated by the application of industry reliability standards.
• Component failure modes and their distribution (FMD) based on the primary function of the device.
• Pin failure mode analysis (Pin FMA).

Figure 1-1 shows the device functional block diagram for reference.

Figure 1-1 Functional Block Diagram

TPS6281x-Q1 was developed using a quality-managed development process, but was not developed in accordance with the IEC 61508 or ISO 26262 standards.