SLUK023A February 2019 – June 2024 UC1825B-SP
1.2 Device Details
Table 1-1 lists the device information used in the initial TID LDR characterization.
Table 1-1 Device and Exposure Details
| TID LDR Details: Up to 100 krad(Si) | |
|---|---|
| TI Device Number | UC1825B-SP (5962R8768106VYC) |
| Package | 16-pin Ceramic Flatpack HKT |
| Technology | Bipolar Process (JI) |
| Quantity Tested | 62 |
| Die Lot Number | 8068289SHE |
| A/T Lot Number / Date Code | 8005223MMT / 1827B |
| Lot Accept/Reject | Devices functional up to 100krad(Si) |
| LDR Radiation Facility | RAD/Aeroflex in Colorado Springs, Colorado |
| LDR Dose Level | 3krad(Si), 10krad(Si), 30 krad(Si), 50krad(Si), 100krad(Si) |
| LDR Dose Rate | 0.01rad(Si)/s |
| LDR Radiation Source | 60Co gamma cell |
| Irradiation Temperature | Ambient, room temperature |
Figure 1-1 Device Used in
Exposure