Abstract

The purpose of this study was to characterize the effects of heavy-ion irradiation on the single-event latch-up (SEL) performance of the TLV1704-SEP 2.2V to 24V, microPower comparator. Heavy-ions with an LET_EFF of 43MeV-cm²/ mg were used to irradiate the devices with a fluence of 1 × 10⁷ ions/cm². The results demonstrate that the TLV1704-SEP is SEL-free up to LET_EFF = 43MeV-cm²/ mg at 125°C. Characterization of single-event transients (SET) was also performed, up to a surface LET_EFF = 50MeV-cm2 / mg at 125°C.