Abstract

This report covers the radiation characterization results of the DAC121S101-SEP, a single channel, 12-bit digital-to-analog converter (DAC). The study was done to determine Total Ionizing Dose (TID) effects under high dose rate (HDR) up to 30 krad(Si). The results show that all samples passed within the specified limits up to 30 krad(Si). To maintain the following results, the Radiation Lot Acceptance Testing (RLAT) was performed using 5 units at a dose level of 30 krad(Si) that are required for future wafer lots. Furthermore, the DAC121S101 is packaged in a space enhanced plastic for low outgassing characteristics and is Single Event Latch-Up (SEL) immune up to 43 MeV-cm2 /mg making the device an excellent choice for low Earth orbit space applications.