SFFSAD7 June 2025 TPS4HC120-Q1
PRODUCTION DATA
The failure mode distribution estimation for the TPS4HC120-Q1 in Table 3-1 comes from the combination of common failure modes listed in standards such as IEC 61508 and ISO 26262, the ratio of sub-circuit function size and complexity, and from best engineering judgment.
The failure modes listed in this section reflect random failure events and do not include failures resulting from misuse or overstress.
| Die Failure Modes | Failure Mode Distribution (%) |
|---|---|
| VOUT open (Hi-Z) | 20 |
| VOUT stuck on (VBB) | 10 |
| VOUT functional, not within specification (voltage or timing) | 50 |
| Diagnostics not within specification | 10 |
| Protection function fails to trip | 10 |