4 Pin Failure Mode Analysis (Pin FMA)

This section provides a failure mode analysis (FMA) for the pins of LM5125-Q1, LM5125A-Q1, and LM51251A-Q1 (VQFN package). The failure modes covered in this document include the typical pin-by-pin failure scenarios:

• Pin short-circuited to ground (see Table 4-10, Table 4-10, and Table 4-10)
• Pin open-circuited (see Table 4-11, Table 4-11, and Table 4-11)
• Pin short-circuited to an adjacent pin (see Table 4-12, Table 4-12, and Table 4-12)
• Pin short-circuited to V_I (see Table 4-13, Table 4-13, and Table 4-13)

Table 4-10 through Table 4-13 also indicate how these pin conditions can affect the device as per the failure effects classification in Table 4-1.

Following are the assumptions of use and the device configuration assumed for the pin FMA in this section:

• The device is used within the Recommended Operation Conditions and the Absolute Maximum Ratings found in the LM5125-Q1, LM5125A-Q1, and LM51251A-Q1 data sheets.
• For the analysis, the typical application is used as shown in the Typical Application section of the LM5125-Q1, LM5125A-Q1, and LM51251A-Q1 data sheets.
• V_SUPPLY = 12V
• V_OUT = 24V