SFFSA43A December 2024 – September 2025 LM5125-Q1 , LM5125A-Q1
1 Overview
This document contains information for LM5125-Q1, LM5125A-Q1, and LM51251A-Q1 (VQFN package) to aid in a functional safety system design. Information provided are:
- Functional safety failure in time (FIT) rates of the semiconductor component estimated by the application of industry reliability standards
- Component failure modes and distribution (FMD) based on the primary function of the device
- Pin failure mode analysis (pin FMA)
Figure 1-1, Figure 1-2, and Figure 1-3 show the device functional block diagrams for reference.
Figure 1-1 LM5125-Q1 Functional Block Diagram
Figure 1-2 LM5125A-Q1 Functional Block Diagram
Figure 1-3 LM51251A-Q1 Functional Block DiagramThe LM5125-Q1, LM5125A-Q1, and LM51251A-Q1 devices were developed using a quality-managed development process, but were not developed in accordance with the IEC 61508 or ISO 26262 standards.