SFFS807 June 2024 TCAN3403-Q1 , TCAN3404-Q1
This section provides functional safety failure in time (FIT) rates for the TCAN340x-Q1 based on two different industry-wide used reliability standards:
| FIT IEC TR 62380 / ISO 26262 | FIT (Failures Per 109 Hours) 8-pin SOIC (D) | FIT (Failures Per 109 Hours) 8-pin SOT (DDF) | FIT (Failures Per 109 Hours) 8-pin VSON (DRB) |
|---|---|---|---|
| Total component FIT rate | 9 | 4 | 6 |
| Die FIT rate | 2 | 2 | 2 |
| Package FIT rate | 7 | 2 | 4 |
The failure rate and mission profile information in Table 2-1 comes from the reliability data handbook IEC TR 62380 / ISO 26262 part 11:
| Table | Category | Reference FIT Rate | Reference Virtual TJ |
|---|---|---|---|
| 5 | CMOS/BICMOS ASICs analog and mixed = < 50V supply | 25 FIT | 55°C |
The reference FIT rate and reference virtual TJ (junction temperature) in Table 2-2 come from the Siemens Norm SN 29500-2 tables 1 through 5. Failure rates under operating conditions are calculated from the reference failure rate and virtual junction temperature using conversion information in SN 29500-2 section 4.